Login / Signup
A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester.
Érika F. Cota
Luigi Carro
Marcelo Lubaszewski
Published in:
DATE (1999)
Keyphrases
</>
preprocessing
cost function
linear model
similarity measure
pairwise
dynamic programming
test cases
computational complexity
np hard
clustering method
segmentation method
fault diagnosis