Automatic generation of in-circuit tests for board assembly defects.

Harm van Schaaijk Martien Spierings Erik Jan Marinissen

Published in: ETS (2018)

Keyphrases

printed circuit boards
circuit board
high speed
automatically generate
defect detection
real time
expert systems
learning algorithm
integrated circuit
assembly systems
electronic circuits
visually guided
knowledge base
decision trees
test cases
database
machine learning
analog circuits