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A Low-Cost Test Solution for Reliable Communication in Networks-on-Chip.
Biswajit Bhowmik
Santosh Biswas
Jatindra Kumar Deka
Bhargab B. Bhattacharya
Published in:
J. Electron. Test. (2019)
Keyphrases
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communication channels
low cost
cost effective
real time
high speed
single chip
high bandwidth
digital camera
optimal solution
social networks
test data
highly efficient
high density
complex networks
low power
network analysis