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AC stress reliability study of a new high voltage transistor for logic memory circuits.

Jordan LocatiVincenzo Della MarcaChristian RiveroArnaud RégnierStephan NielKarine Coulié
Published in: IRPS (2020)
Keyphrases
  • high voltage
  • high speed
  • training data
  • artificial neural networks
  • digital circuits
  • logic circuits