Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing.
Haralampos-G. D. StratigopoulosYiorgos MakrisPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
- low cost
- machine learning
- error rate
- real time
- machine learning methods
- machine learning algorithms
- data mining
- learning algorithm
- learning systems
- pattern recognition
- knowledge acquisition
- test cases
- text mining
- natural language processing
- error bounds
- low power
- highly efficient
- learning tasks
- software testing
- single chip
- analog circuits
- test set
- computational intelligence
- supervised learning
- relevance feedback
- decision trees
- feature selection
- semi supervised learning
- digital camera
- active learning
- machine learning approaches
- error analysis
- explanation based learning
- error detection
- radio frequency
- artificial intelligence
- vlsi architecture
- analog vlsi