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U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors.

Florian KälberOkan KöpüklüNicolas H. LehmentGerhard Rigoll
Published in: VISIGRAPP (5: VISAPP) (2021)
Keyphrases
  • defect detection
  • automated visual inspection
  • building blocks
  • quality control
  • databases
  • neural network
  • artificial intelligence
  • printed circuit boards