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A novel DFT technique for critical bridging faults in CMOS and BiCMOS ICs.

Michele FavalliBruno RiccòL. Penza
Published in: ED&TC (1995)
Keyphrases
  • fault diagnosis
  • power consumption
  • low cost
  • frequency domain
  • fault detection
  • low power
  • discrete fourier transform
  • mixed signal
  • multiscale
  • multiresolution
  • image sensor
  • focal plane