Login / Signup
Robust Coupling Delay Test Sets.
Joonhwan Yi
John P. Hayes
Published in:
J. Electron. Test. (2012)
Keyphrases
</>
test set
training set
error rate
training data
test cases
neural network
test data
evaluation methodology
real time
partial occlusion
bayesian networks
text mining
computationally efficient
test collection
cross validation
robust estimation