Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes.
Hanna SonedaMasaki HashizumeHiroyuki YotsuyanagiShyue-Kung LuPublished in: 3DIC (2019)
Keyphrases
- high accuracy
- cost function
- experimental evaluation
- support vector machine
- synthetic data
- similarity measure
- fully automatic
- high precision
- test data
- theoretical analysis
- probabilistic model
- dynamic programming
- significant improvement
- pairwise
- data sets
- computational cost
- detection method
- segmentation method
- classification method
- preprocessing
- video sequences
- statistical significance