Session 8 - Characterization and test methods for device variability in nanoscale technologies.

Hamid Mahmoodi Jeanne Trinko Mechler

Published in: CICC (2008)

Keyphrases

neural network
computational cost
machine learning
social networks
information systems
computer science
preprocessing
significant improvement
statistical tests
database
machine learning methods
test data
support vector machine
association rules
feature space
artificial intelligence
data mining
data sets
real time