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Extending trace history through tapered summaries in post-silicon validation.

Sandeep ChandranPreeti Ranjan PandaDeepak ChauhanSharad KumarSmruti R. Sarangi
Published in: ASP-DAC (2016)
Keyphrases
  • low cost
  • high speed
  • finite element
  • low power
  • high density
  • neural network
  • real world
  • genetic algorithm
  • information retrieval systems
  • transmission electron microscopy