A high reliability under-voltage lock out circuit for power driver IC.
Liqiang DingXiaowu CaiMali GaoRuirui XiaYuexin GaoPublished in: Integr. (2023)
Keyphrases
- high reliability
- duty cycle
- single phase
- high precision
- real time
- low cost
- power losses
- low voltage
- power supply
- electrical power
- dc dc converter
- low overhead
- power quality
- integrated circuit
- control algorithm
- power consumption
- short circuit
- reactive power
- active power
- cmos technology
- concurrency control
- power system
- high voltage
- power reduction
- power management
- power dissipation
- database systems
- neural network