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On optimizing VLSI testing for product quality using die-yield prediction.
Adit D. Singh
C. Mani Krishna
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
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product quality
process control
manufacturing processes
quality control
quality improvement
software product
product development
manufacturing process
real time
website
software quality
software process
artificial intelligence
multi agent
knowledge representation