Embedded DRAM in 45-nm Technology and Beyond.
Darren AnandKevin W. GormanMark JacunskiAdrian PaparelliPublished in: IEEE Des. Test Comput. (2011)
Keyphrases
- nm technology
- embedded dram
- cmos technology
- low power
- power consumption
- power dissipation
- random access memory
- dynamic random access memory
- low voltage
- low cost
- high speed
- digital signal processing
- power management
- design methodology
- design considerations
- metal oxide semiconductor
- finite state machines
- data management
- pattern recognition