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Methods and Metrics for Reliability Assessment.
Lirida Alves de Barros Naviner
Jean-François Naviner
Denis Teixeira Franco
Maí Correia R. de Vasconcelos
Published in:
Fault-Tolerant Distributed Algorithms on VLSI Chips (2008)
Keyphrases
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empirical studies
benchmark datasets
artificial intelligence
significant improvement
computationally expensive
genetic algorithm
learning algorithm
image processing
expert systems
probabilistic model
methods require
reliability assessment