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Review and future prospects of low-voltage RAM circuits.

Yoshinobu NakagomeMasashi HoriguchiTakayuki KawaharaKiyoo Itoh
Published in: IBM J. Res. Dev. (2003)
Keyphrases
  • low voltage
  • random access memory
  • design considerations
  • cmos technology
  • power line
  • power management
  • low power
  • high speed
  • leakage current
  • image processing
  • low cost
  • cost effective
  • power consumption