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A novel scheme to reduce test application time in circuits with full scan.
Dhiraj K. Pradhan
Jayashree Saxena
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)
Keyphrases
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database
artificial intelligence
data mining
social networks
image segmentation
bayesian networks
data structure
high speed
statistical tests
learning scheme