A Low Cost BIST Methodology and Associated Novel Test Pattern Generator.

Sen-Pin Lin Sandeep K. Gupta Melvin A. Breuer

Published in: EDAC-ETC-EUROASIC (1994)

Keyphrases

pattern generator
low cost
real time
design methodology
digital camera
built in self test
humanoid robot
data mining
data sets
multi agent systems
spatio temporal
image analysis
bayesian networks
multi modal
machine learning
low power
real world
database