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Long-Term Performance of Magnetic Force Microscopy Tips Grown by Focused Electron Beam Induced Deposition.
Alix Tatiana Escalante-Quiceno
Ondrej Novotný
Jan Neuman
Cesar Magen
José María De Teresa
Published in:
Sensors (2023)
Keyphrases
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electron beam
long term
x ray
short term
design parameters
semiconductor devices
integrated circuit
permalloy films
magnetic field
image analysis
high throughput
film thickness
thin film
three dimensional
electron microscopy
microscopy images
knowledge base
contact force
decision making
real world