Solar Wafers Counting Based on Image Texture Feature.
Qian ZhangBo-quan LiZhi-quan SunYu-Jun LiChang-yun PanPublished in: IGTA (2015)
Keyphrases
- image features
- texture features
- color features
- input image
- scale and rotation invariant
- multiscale
- image analysis
- image content
- image data
- image retrieval
- image texture
- low level
- image segmentation
- image representation
- gray level
- rotation invariant
- textural features
- texture classification
- segmentation method
- computer vision
- texture analysis
- texture feature extraction
- texture images
- color and texture features
- texture description
- face detection
- local binary pattern
- spatial information
- segmentation algorithm
- feature vectors
- object recognition
- similarity measure
- image processing