VLSI Functional Test Pattern Generation: A Design and Implementation.
Tonysheng LinStephen Y. H. SuPublished in: ITC (1985)
Keyphrases
- low cost
- single chip
- vlsi architecture
- vlsi implementation
- implementation issues
- design methodology
- chip design
- hardware design
- design decisions
- circuit design
- design considerations
- computer architecture
- efficient implementation
- case study
- modular design
- functional verification
- detailed design
- database
- current status
- design principles
- design process
- signal processing