Scalable model for predicting the effect of negative bias temperature instability for reliable design.
Sarvesh BhardwajWenping WangRakesh VattikondaYu CaoSarma B. K. VrudhulaPublished in: IET Circuits Devices Syst. (2008)
Keyphrases
- conceptual model
- probabilistic model
- knowledge base
- computational model
- theoretical framework
- genetic algorithm
- high level
- management system
- statistical model
- mathematical model
- layout design
- neural network
- modelling language
- metamodel
- neural network model
- experimental data
- power system
- maximum likelihood
- hidden markov models
- training data
- image sequences
- case study
- artificial intelligence