Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry.
Duc-Phuc NguyenKhoa LeTrungFakhreddine GhaffariDavid DeclercqPublished in: APCC (2019)
Keyphrases
- flash memory
- garbage collection
- main memory
- solid state
- random access
- buffer management
- file system
- embedded systems
- error detection
- data storage
- b tree
- disk drives
- hand held devices
- database systems
- image processing
- storage management
- failure rate
- storage devices
- storage systems
- data structure
- small size
- databases
- real time
- open source
- software engineering
- object oriented
- mobile devices
- database