On the decline of testing efficiency as fault coverage approaches 100%.
Li-C. WangM. Ray MercerSophia W. KaoThomas W. WilliamsPublished in: VTS (1995)
Keyphrases
- data sets
- artificial neural networks
- alternative approaches
- artificial intelligence
- multimedia
- strengths and weaknesses
- computational efficiency
- pros and cons
- high efficiency
- highly efficient
- object oriented
- multiresolution
- optimal solution
- clustering algorithm
- website
- image processing
- genetic algorithm
- neural network