Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains.
Laung-Terng WangXiaoqing WenShianling WuHiroshi FurukawaHao-Jan ChaoBoryau SheuJianghao GuoWen-Ben JonePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)