NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits.
Nils HeidmannNico HellwegeSteffen PaulDagmar Peters-DrolshagenPublished in: IRPS (2015)
Keyphrases
- reliability analysis
- analog vlsi
- behavioral models
- floating gate
- circuit design
- hierarchical structures
- focal plane
- dynamic behaviors
- mixed signal
- architectural models
- conceptual model
- condition monitoring
- delay insensitive
- neural network
- databases
- decision making
- low power
- fault diagnosis
- genetic algorithm
- machine learning