An automatic temperature compensation of internal sense ground for subquarter micron DRAM's.
Tsukasa OoishiYuichiro KomiyaKei HamadeMho AsakuraKenichi YasudaKiyohiro FurutaniHideto HidakaHiroshi MiyamotoHideyuki OzakiPublished in: IEEE J. Solid State Circuits (1995)