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Stochastic testing simulator for integrated circuits and MEMS: Hierarchical and sparse techniques.
Zheng Zhang
Xiu Yang
Giovanni Marucci
Paolo Maffezzoni
Ibrahim Abe M. Elfadel
George E. Karniadakis
Luca Daniel
Published in:
CICC (2014)
Keyphrases
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integrated circuit
high dimensional
sparse data
electron beam
hierarchical structure
learning automata
hierarchical model
compressed sensing
data sets
test cases
test data
coarse to fine
compressive sensing
stochastic processes
hardware description language