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Bit Cell in 32 nm High-k Metal-Gate CMOS.

Sarvesh H. KulkarniZhanping ChenJun HeLei JiangM. Brian PedersenKevin Zhang
Published in: IEEE J. Solid State Circuits (2010)
Keyphrases
  • nm technology
  • cmos technology
  • power consumption
  • low power
  • metal oxide semiconductor
  • wide range
  • high speed
  • random access memory
  • low cost
  • parallel processing
  • silicon on insulator
  • data sets
  • high temperature