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A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application.

Yan LiXu ChengChiyu TanJun HanYuanfu ZhaoLiang WangTongde LiMehdi B. TahooriXiaoyang Zeng
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2020)
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