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The wire sag problem in wire bonding technology for semiconductor packaging.

Huang-Kuang KungHung-Shyong ChenMing-Cheng Lu
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • wire bonding
  • bond pad
  • stress response
  • rapid development
  • neural network
  • case study
  • cost effective
  • optimization algorithm
  • finite element