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An Incomplete Scan Design Approach to Test Generation for Sequential Machines.

Hi-Keung Tony MaA. Richard NewtonSrinivas DevadasAlberto L. Sangiovanni-Vincentelli
Published in: ITC (1988)
Keyphrases
  • test generation
  • design automation
  • building blocks
  • software development
  • case study
  • open source
  • pattern matching
  • life cycle