Sign in

Multi-physics reliability simulation for solid state lighting drivers.

S. TarashioonW. D. van DrielG. Q. Zhang
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • solid state
  • flash memory
  • random access
  • disk drives
  • metal oxide
  • viewpoint
  • software engineering
  • real time
  • high speed
  • single image