First Experimental Study of Floating-Body Cell Transient Reliability Characteristics of Both N- and P-Channel Vertical Gate-All-Around Devices with Split-Gate Structures.
Cheng-Lin SungSheng-Ting FanHang-Ting LueWei-Chen ChenPei-Ying DuTeng-Hao YehKeh-Chung WangChih-Yuan LuPublished in: IRPS (2022)
Keyphrases
- experimental study
- field effect transistors
- steady state
- high density
- multiple input
- liquid crystal displays
- mathematical analysis
- experimental evaluation
- multi channel
- microscopy images
- markov chain
- thin film transistor
- gate dielectrics
- synthetic datasets
- mobile applications
- wireless channels
- low cost
- mobile devices