Monitoring Aging Defects in STT-MRAMs.

Govind Radhakrishnan Youngki Yoon Manoj Sachdev

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)

Keyphrases

defect detection
monitoring system
software aging
training set
real time
data sets
databases
high resolution
data acquisition
condition monitoring
location prediction
knowledge base
control system
early warning