A Prevenient Voltage Stress Test Method for High Density Memory.
Jongsoo YimGunbae KimIncheol NamSangki SonJonghyoung LimHwacheol LeeSangseok KangByungheon KwakJinseok LeeSungho KangPublished in: DELTA (2008)
Keyphrases
- high density
- memory usage
- significant improvement
- cost function
- detection method
- dynamic programming
- high accuracy
- data sets
- high precision
- test data
- support vector machine
- ieee bus
- close proximity
- segmentation method
- clustering method
- high speed
- preprocessing
- video sequences
- objective function
- data mining
- neural network
- databases