Novel self-test methods to reduce on-chip memory requirements and improved test coverage.
Prakash NarayananSatish RavichandranBalaji RamayanamPublished in: IOLTS (2014)
Keyphrases
- memory requirements
- statistical tests
- statistical significance
- empirical studies
- computational speed
- test suite
- preprocessing
- high speed
- experimental design
- test cases
- analog vlsi
- qualitative and quantitative
- machine learning methods
- data sets
- data mining techniques
- search algorithm
- decision trees
- search engine
- data mining