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A genetic algorithm framework for test generation.
Elizabeth M. Rudnick
Janak H. Patel
Gary S. Greenstein
Thomas M. Niermann
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)
Keyphrases
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genetic algorithm
test generation
test cases
neural network
cooperative
software testing
database
databases
feature selection
pattern matching