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A genetic algorithm framework for test generation.

Elizabeth M. RudnickJanak H. PatelGary S. GreensteinThomas M. Niermann
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)
Keyphrases
  • genetic algorithm
  • test generation
  • test cases
  • neural network
  • cooperative
  • software testing
  • database
  • databases
  • feature selection
  • pattern matching