Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs.

D. Favero Carlo De Santi Kalparupa Mukherjee Karen Geens Matteo Borga Benoit Bakeroot Shuzhen You Stefaan Decoutere Gaudenzio Meneghesso Enrico Zanoni Matteo Meneghini

Published in: IRPS (2022)

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