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On Reducing Test Power, Volume and Routing Cost by Chain Reordering and Test Compression Techniques.

Chia-Yi LinLi-Chung HsuHung-Ming Chen
Published in: IEICE Trans. Electron. (2010)
Keyphrases
  • multiscale
  • image compression
  • test cases
  • neural network
  • information systems
  • image processing
  • decision trees
  • shortest path
  • statistical tests
  • total cost
  • statistical significance
  • high cost
  • testing process