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On Reducing Test Power, Volume and Routing Cost by Chain Reordering and Test Compression Techniques.
Chia-Yi Lin
Li-Chung Hsu
Hung-Ming Chen
Published in:
IEICE Trans. Electron. (2010)
Keyphrases
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multiscale
image compression
test cases
neural network
information systems
image processing
decision trees
shortest path
statistical tests
total cost
statistical significance
high cost
testing process