Automatic inspection of solder joints using layered illumination.

Tae-Hyeon Kim Tai-Hoon Cho Young Shik Moon Sung-Han Park

Published in: ICIP (2) (1996)

Keyphrases

automatic inspection
vision system
single image
imaging conditions
illumination conditions
viewpoint
lighting conditions
machine vision
color constancy
illumination invariant
face recognition under varying
partial occlusion
real time
computer vision
robust face recognition
global illumination