An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers.
Anand GopalanTejasvi DasClyde WashburnP. R. MukundPublished in: VLSI Design (2005)
Keyphrases
- high noise
- low signal to noise ratio
- high speed
- built in self test
- high density
- noise level
- low cost
- image noise
- noise model
- radio frequency
- random noise
- circuit design
- noise reduction
- physical design
- missing data
- neural network
- bandpass
- noisy data
- relevance feedback
- multiresolution
- geometric distortions
- additive noise
- image structure
- signal to noise ratio
- single chip
- signal noise ratio
- real time