Time-dependent dielectric breakdown statistics in SiO2 and HfO2 dielectrics: Insights from a multi-scale modeling approach.
Andrea PadovaniLuca LarcherPublished in: IRPS (2018)
Keyphrases
- leakage current
- multiscale
- electrical properties
- low voltage
- image segmentation
- statistical modeling
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- image processing
- bayesian networks
- machine learning
- image representation
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- modeling framework
- modeling method
- natural images
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- case study
- information systems
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