Automated catastrophic optical damage inspection of semiconductor laser chip based on multi-scale strip convolution aggregation.
Shuai GuoDengao LiJumin ZhaoHuayu JiaBiao LuoBao TangYuxiang LvPublished in: Int. J. Mach. Learn. Cybern. (2024)
Keyphrases
- focal plane
- multiscale
- analog vlsi
- high speed
- image processing
- convolution kernel
- natural images
- scale space
- image representation
- semiconductor manufacturing
- wavelet transform
- edge detection
- semi automated
- computer vision
- image segmentation
- aggregation operators
- data aggregation
- solid state
- optic flow
- quality control
- laser beam
- coarse to fine
- low cost