Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors.
Chandni AkbarYiming LiNarasimhulu ThotiPublished in: IEEE Access (2022)
Keyphrases
- field effect transistors
- machine learning
- semiconductor devices
- steady state
- high density
- schottky barrier
- mathematical analysis
- machine learning methods
- natural language processing
- pattern recognition
- line segments
- learning tasks
- learning algorithm
- computational biology
- machine learning approaches
- text mining
- machine learning algorithms
- computer vision
- high speed
- text classification
- decision trees
- statistical methods
- inductive learning
- artificial intelligence
- data mining
- explanation based learning
- electron beam
- feature selection
- knowledge acquisition
- knowledge representation
- active learning
- inductive logic programming
- learning problems
- transfer learning
- learning systems
- computational intelligence
- expert systems