A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences.
Ioannis VoyiatzisPublished in: VLSI Design (2008)
Keyphrases
- low cost
- vector space
- test sequences
- hidden markov models
- built in self test
- hough transform
- pseudorandom
- test data
- low power
- automatically generated
- dimensionality reduction
- real time
- classification scheme
- integrated circuit
- watermarking algorithm
- data hiding
- nonlinear dimensionality reduction
- pairwise
- genetic algorithm
- watermark embedding
- data hiding scheme
- information hiding scheme
- data sets