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A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias Dependence of Gate-Overlap Capacitance.

Takashi SatoToshiki KanamotoSaiko KobayashiNobuhiko GotoTakao SatoHitoshi SugiharaHiroo Masuda
Published in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2010)
Keyphrases
  • high speed
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  • database
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  • genetic algorithm
  • artificial intelligence
  • information systems
  • multi agent systems
  • expert systems
  • trade off
  • modeling framework
  • cmos technology