The Weighted Syndrome Sums Approach to VLSI Testing.

Zeev Barzilai Jacob Savir George Markowsky Merlin G. Smith

Published in: IEEE Trans. Computers (1981)

Keyphrases

signal processing
test cases
vlsi design
e learning
machine learning
information retrieval
information systems
pattern recognition
high speed
random variables
test data
weighted graph
vlsi circuits