Login / Signup
Circuit analysis and optimization driven by worst-case distances.
Kurt Antreich
Helmut E. Graeb
Claudia U. Wieser
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
</>
worst case
statistical analysis
data driven
data analysis
data mining
artificial intelligence
case study
high speed
error bounds
quantitative analysis