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Circuit analysis and optimization driven by worst-case distances.

Kurt AntreichHelmut E. GraebClaudia U. Wieser
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
  • worst case
  • statistical analysis
  • data driven
  • data analysis
  • data mining
  • artificial intelligence
  • case study
  • high speed
  • error bounds
  • quantitative analysis