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Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions.
Debashis Bhattacharya
Prathima Agrawal
Vishwani D. Agrawal
Published in:
DAC (1992)
Keyphrases
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test generation
boolean expressions
power dissipation
test cases
normal form
real valued
quality assurance
conjunctive queries
static analysis
software testing
inverted lists
open source